Browsing by Author "Baugh, C. M."
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- ItemNarrow-band surveys for very high redshift Lyman-alpha emitters(EDP SCIENCES S A, 2007) Nilsson, K. K.; Orsi, A.; Lacey, C. G.; Baugh, C. M.; Thommes, E.Context. Many current and future surveys aim to detect the highest redshift ( z greater than or similar to 7) sources through their Lyman-alpha (Ly alpha) emission, using the narrow- band imaging method. However, to date the surveys have only yielded non- detections and upper limits as no survey has reached the necessary combination of depth and area to detect these very young star forming galaxies.
- ItemThe effect of assembly bias on redshift-space distortions(2019) Padilla, Nelson; Contreras, S.; Zehavi, I.; Baugh, C. M.; Norberg, P.
- ItemThe evolution of assembly bias(2019) Contreras, S.; Zehavi, I.; Padilla, Nelson; Baugh, C. M.; Jiménez, E.; Lacerna Zambrano, Iván Andrés
- ItemThe galaxy-dark matter halo connection : which galaxy properties are correlated with the host halo mass?(2015) Contreras, S.; Baugh, C. M.; Norberg, P.; Padilla, Nelson