Browsing by Author "Theobald, W."

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    Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)
    (2016) Valdivia, M. P.; Stutman, D.; Stoeckl, C.; Mileham, C.; Begishev, I. A.; Theobald, W.; Bromage, J.; Regan, S. P.; Veloso Espinosa, Felipe Eduardo; Muñoz Cordovez, G.; Vescovi, M.; Valenzuela Villaseca, V.; Klein, S. R.
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    Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic
    (AIP Publishing, 2021) Valdivia, M. P.; Stutman, D.; Stoeckl, C.; Theobald, W.; Collins, G. W.; Bouffetier, V; Vescovi, M.; Mileham, C.; Begishev, I. A.; Klein, S. R.; Melean, R.; Muller, S.; Zou, J.; Veloso, F.; Casner, A.; Beg, F. N.; Regan, S. P.
    C Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10-150 J, 8-30 ps laser pulses, while two pulsed-power generators (similar to 350 kA, 350 ns and similar to 200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >10(23) cm(-3). Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. The results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP. Published under an exclusive license by AIP Publishing.
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    X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry
    (2018) Valdivia, M. P.; Veloso, F.; Stutman, D.; Stoeckl, C.; Mileham, C.; Begishev, I. A.; Theobald, W.; Vescovi, M.; Useche Duque, Wilmer Eleazer; Regan, S. P.; Albertazzi, B.; Rigon, G.; Mabey, P.; Michel, T.; Pikuz, S. A.; Koenig, M.; Casner, A.