Local Equating Using the Rasch Model, the OPLM, and the 2PL IRT Model-or-What Is It Anyway if the Model Captures Everything There Is to Know About the Test Takers?

Simple item page
dc.contributor.authorGonzález Burgos, Jorge Andrés
dc.contributor.authorVon Davier, M.
dc.contributor.authorVon Davier, A.
dc.date.accessioned2021-01-14T19:10:59Z
dc.date.available2021-01-14T19:10:59Z
dc.date.issued2013
dc.format.extent9 páginas
dc.fuente.origenConveris
dc.identifier.doi10.1111/jedm.12016
dc.identifier.issn0022-0655
dc.identifier.urihttps://doi.org/10.1111/jedm.12016
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/50274
dc.issue.numeroNo. 3
dc.language.isoen
dc.nota.accesoContenido parcial
dc.pagina.final303
dc.pagina.inicio295
dc.revistaJournal of Educational Measurementes_ES
dc.rightsacceso restringido
dc.titleLocal Equating Using the Rasch Model, the OPLM, and the 2PL IRT Model-or-What Is It Anyway if the Model Captures Everything There Is to Know About the Test Takers?es_ES
dc.typeartículo
dc.volumenVol. 50
sipa.codpersvinculados15102
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
Local Equating Using the Rasch Model, the OPLM, and the 2PL IRT Model-or-What Is It Anyway if the Model Captures Everything There Is to Know About the Test Takers - .pdf
Size:
2.56 KB
Format:
Adobe Portable Document Format
Description:
Download
Collections
Artículos de revistas