Ellipsometric thickness and coverage of physisorbed layers of Xe, Kr, Ar and N2 on graphite

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dc.contributor.authorFaul, J.W.O.
dc.contributor.authorVolkmann, Ulrich
dc.contributor.authorKnorr, K.
dc.date.accessioned2020-09-03T18:46:18Z
dc.date.available2020-09-03T18:46:18Z
dc.date.issued1990
dc.date.updated2020-09-03T03:07:12Z
dc.fuente.origenORCID
dc.identifier.doi10.1016/S0039-6028(05)80026-3
dc.identifier.issn0039-6028
dc.identifier.urihttps://doi.org/10.1016/S0039-6028(05)80026-3
dc.identifier.urihttp://www.scopus.com/inward/record.url?eid=2-s2.0-0040489770&partnerID=MN8TOARS
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/43496
dc.issue.numeroNo. 3
dc.language.isoen
dc.nota.accesocontenido parcial
dc.pagina.final394
dc.pagina.inicio390
dc.relation.isformatofSurface Science, vol. 227, no. 3 (mar. 1990), pp. 390-394
dc.revistaSurface Sciencees_ES
dc.rightsacceso restringido
dc.subject.ddc531
dc.subject.deweyMatemática física y químicaes_ES
dc.titleEllipsometric thickness and coverage of physisorbed layers of Xe, Kr, Ar and N2 on graphite
dc.typeartículo
dc.volumenVol. 227
sipa.codpersvinculados100470
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