Multiple-reflections single-shot dispersion scan for fast ultrashort-pulse measurements
dc.article.number | 529440 | |
dc.catalogador | aba | |
dc.contributor.author | Capdeville, Francisco | |
dc.contributor.author | Villanueva, Fernando | |
dc.contributor.author | Hidalgo Rojas, Diego Mauricio | |
dc.contributor.author | Wahaia, Faustino | |
dc.contributor.author | Wheatley, Robert | |
dc.contributor.author | Wallentowitz, Sascha | |
dc.contributor.author | Volkmann, Ulrich | |
dc.contributor.author | Seifert, Birger | |
dc.date.accessioned | 2024-08-22T14:21:33Z | |
dc.date.available | 2024-08-22T14:21:33Z | |
dc.date.issued | 2024 | |
dc.description.abstract | A single-shot non-interferometric ultrashort-pulse measurement method based on the dispersion scan (d-scan) technique with a substantially extended time span for the pulses to be measured is presented. While single-shot d-scan is typically used for rather short femtosecond pulses, the presented multiple-reflections d-scan (MR d-scan) technique allows measurement of both short and long femtosecond pulses. Single-shot d-scan is currently limited to pulses with a maximum duration of 60 fs using a chromatic dispersion, i.e., a group delay dispersion (GDD) of 4400 fs2 at 840 nm provided by customized random nonlinear crystals. MR d-scan achieves a GDD of 31100 fs2 at 820 nm in this work, but can generally achieve an increase in GDD of up to two orders of magnitude. MR d-scan works with commonly available output couplers, does not rely on a homogeneous, precisely imaged beam profile and has an in-line configuration. As an example, long femtosecond double pulses are measured and reconstructed. | |
dc.description.funder | ANID (Millennium Science Initiative Program ICN17_012) | |
dc.fechaingreso.objetodigital | 2024-08-21 | |
dc.fuente.origen | ORCID | |
dc.identifier.doi | 10.1364/OE.529440 | |
dc.identifier.eissn | 1094-4087 | |
dc.identifier.uri | https://doi.org/10.1364/OE.529440 | |
dc.identifier.uri | https://repositorio.uc.cl/handle/11534/87593 | |
dc.information.autoruc | Instituto de Física; Volkmann , Ulrich Georg; 0000-0003-4972-5558; 100470 | |
dc.issue.numero | 16 | |
dc.language.iso | en | |
dc.nota.acceso | contenido completo | |
dc.pagina.final | 28752 | |
dc.pagina.inicio | 28742 | |
dc.revista | Optics express | |
dc.rights | acceso abierto | |
dc.subject.ddc | 510 | |
dc.subject.dewey | Matemática física y química | es_ES |
dc.title | Multiple-reflections single-shot dispersion scan for fast ultrashort-pulse measurements | |
dc.type | artículo | |
dc.volumen | 32 | |
sipa.codpersvinculados | 100470 | |
sipa.trazabilidad | ORCID;2024-07-15 |
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