X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

Simple item page
dc.contributor.authorValdivia, M. P.
dc.contributor.authorVeloso, F.
dc.contributor.authorStutman, D.
dc.contributor.authorStoeckl, C.
dc.contributor.authorMileham, C.
dc.contributor.authorBegishev, I. A.
dc.contributor.authorTheobald, W.
dc.contributor.authorVescovi, M.
dc.contributor.authorUseche Duque, Wilmer Eleazer
dc.contributor.authorRegan, S. P.
dc.contributor.authorAlbertazzi, B.
dc.contributor.authorRigon, G.
dc.contributor.authorMabey, P.
dc.contributor.authorMichel, T.
dc.contributor.authorPikuz, S. A.
dc.contributor.authorKoenig, M.
dc.contributor.authorCasner, A.
dc.date.accessioned2020-01-20T19:46:33Z
dc.date.available2020-01-20T19:46:33Z
dc.date.issued2018
dc.fechaingreso.objetodigital2024-08-16
dc.fuente.origenBibliotecas UC
dc.identifier.doi10.1063/1.5039342
dc.identifier.issn0034-6748
dc.identifier.urihttps://doi.org/10.1063/1.5039342
dc.identifier.urihttps://repositorio.uc.cl/handle/11534/28233
dc.issue.numeroNo. 10
dc.language.isoen
dc.nota.accesoContenido completo
dc.revistaReview Of Scientific Instrumentses_ES
dc.rightsacceso abierto
dc.subject.ddc510
dc.subject.deweyMatemática física y químicaes_ES
dc.subject.otherInterferometriaes_ES
dc.subject.otherElectroneses_ES
dc.subject.otherRayos x - Medicioneses_ES
dc.titleX-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometryes_ES
dc.typeartículo
dc.volumenVol. 89
sipa.codpersvinculados14943
sipa.codpersvinculados1050344
Files
Original bundle
Now showing 1 - 1 of 1
Thumbnail Image
Name:
X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry.pdf
Size:
1.37 MB
Format:
Adobe Portable Document Format
Description:
Download
Collections
Artículos de revistas